Microscopy
"Microscopic Image Analysis for Life Science Applications"
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"Bioinformatics & Biomedical Imaging" series; Bioimaging in life sciences is a burgeoning area that is of growing interest to professionals and researchers in the field. This book bridges the gap between biomedical imaging and the bioscience community. It gives professionals a detailed understanding of imaging platforms, fluorescence imaging, and fundamental image processing algorithms. With illustrations (some col.). Hardback, 432 pages. Size: 257 x 183 mm. Weight: 1129g.
Author: (Rittscher, Jens, ed.)
ISBN: 1596932368
Publisher: Artech House
Date: 2008 (United Kingdom)
Readership: Professional & Vocational Microscopy
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"Progress in Nano-Electro-Optics"Basics and Theory of Near-Field Optics
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"Springer Series in Optical Sciences" series; Focusing on major aspects of nano-electro-optics, this text covers fibre probes and related devices, modulation of electron beams by optical near-fields, fluorescence spectroscopy, near-field photoluminescence spectroscopy of semiconductor quantum dots and quantum theory of the optical near-field. With 118 illus.. Hardback, 178 pages. Size: 234 x 156 mm. Weight: 381g.
Author: (Ohtsu, Motoichi, ed.)
ISBN: 3540435042
Publisher: Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
Date: 2002 (Germany)
Readership: Professional & Vocational Microscopy
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"Scanning Probe Microscopies Beyond Imaging"Manipulation of Molecules and Nanostructures
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Focusses on the use of SPMs to actively manipulate molecules and nanostructures on surfaces. This book reviews progress in the use of SPMs on such soft materials as polymers, with an emphasis on chemical discrimination, mechanical properties, tip-induced reactions and manipulations, as well as their nanoscale electrical properties. With illustrations. Hardback, 570 pages. Size: 246 x 186 mm. Weight: 1197g.
Author: (Samori, Paolo, ed.)
ISBN: 3527312692
Publisher: John Wiley and Sons Ltd
Date: 2006 (Germany)
Readership: Professional & Vocational Microscopy
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"Scanning Probe Microscopy"Analytical Methods
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"Nanoscience and Technology" series; This text provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of application of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed. With 139 figs.. Hardback, 228 pages. Size: 242 x 162 mm. Weight: 522g.
Author: (Wiesendanger, R., ed.)
ISBN: 3540638156
Publisher: Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
Date: 1998 (Germany)
Readership: Professional & Vocational Microscopy
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"Scanning Tunneling Microscopy and Its Application"
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"Springer Series in Surface Sciences" series; Scanning tunneling microscopy (STM) is a powerful technique for surface analysis with atomic resolution. The book should appeal to researchers, advanced students and analysts in industrial laboratories. With illustrations. 2nd ed. Hardback, 383 pages. Size: 241 x 165 mm. Weight: 658g.
Author: Bai, Chunli
ISBN: 3540657150
Publisher: Springer-Verlag New York Inc
Date: (Usa)
Readership: General Microscopy
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"Electron Microscopy"Principles and Techniques for Biologists
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2 rev ed. Hardback, 670 pages. Size: 287 x 218 mm. Weight: 2509g.
Author: Bozzola, J.J.
ISBN: 0763701920
Publisher: Jones and Bartlett Publishers, Inc
Date: 1998 (United States)
Readership: Professional & Vocational Microscopy
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"Principles of Nuclear Magnetic Resonance Microscopy"
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An introduction to a technique which is potentially important in fundamental biology and chemical physics, as well as having applications to such fields as petrochemicals, polymers, biotechnology, food processing and natural products. With bibliography. New ed. Paperback, 510 pages. Size: 234 x 156 mm. Weight: 1000g.
Author: Callaghan, Paul T.
ISBN: 0198539975
Publisher: Oxford University Press
Date: 1993 (United Kingdom)
Readership: Professional & Vocational Microscopy
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"Physical Principles of Electron Microscopy"An Introduction to Tem, Sem, and Aem
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Scanning and stationary-beam electron microscopes have become an indispensable tool for research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and practice of electron microscopy. With 122 illus.. 2005. Corr. 2nd. Hardback, 214 pages. Size: 246 x 155 mm. Weight: 414g.
Author: Egerton, Ray
ISBN: 0387258000
Publisher: Springer-Verlag New York Inc.
Date: 2008 (United States)
Readership: Tertiary Education (Us: College) Microscopy
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"Physical Methods for Materials Characterization"
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"Series in Material Science and Engineering" series; Examines the range of techniques used for characterizing the microstructure of materials. This book includes chapters that cover the basic physics required to describe the microstructure of materials and their interaction with various types of radiation. It reflects the changes that have taken place in the field. With illustrations. 2 rev ed. Paperback, 602 pages. Size: 234 x 156 mm. Weight: 1043g.
Author: Flewitt, P.E.J. Wild, R.K.
ISBN: 0750308087
Publisher: Taylor & Francis Ltd
Date: 2003 (United Kingdom)
Readership: Professional & Vocational Microscopy
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"Scanning Electron Microscopy and X-Ray Microanalysis"
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Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more. With illustrations. 3 rev ed. Mixed Media Product, 586 pages. Size: 230 x 188 mm. Weight: 1689g.
Author: Goldstein, Joseph I. Newbury, Dale E. (National Institute of Standards and Technology, Gaithersburg, Md, Usa) Joy, D.C. Lyman, Charles E. (Lehigh University, Bethlehem, Pa, Usa) Echlin, Patrick Lifshin, Eric Sawyer, Linda C. Michael, J.R. (Sandia National Laboratories, Albuquerque, Nm, Usa)
ISBN: 0306472929
Publisher: Kluwer Academic Publishers Group
Date: 2002 (Netherlands)
Readership: Professional & Vocational Microscopy
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"Electron Microscopy and Analysis"
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A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available. With 147 colour illustrations. 3 rev ed. Paperback, 251 pages. Size: 234 x 156 mm. Weight: 476g.
Author: Goodhew, Peter J. Cartwright, L.E. Humphreys, F.J. Beanland, R.
ISBN: 0748409688
Publisher: Taylor & Francis Ltd
Date: 2000 (United Kingdom)
Readership: Professional & Vocational Microscopy
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"Unbiased Stereology"Three-Dimensional Measurement in Microscopy
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"Advanced Methods" series; Unbiased Stereology, second edition expands the comprehensive practical first edition guide to 3-D measurements in microscopy using stereological methods by adding a section on 2-D stereology, or Petri-metrics. With 100 line drawings, 10 b&w photographs. Hardback, 256 pages. Size: 234 x 156 mm. Weight: 584g.
Author: Howard, Vyvyan Reed, M.G.
ISBN: 1859960898
Publisher: Taylor & Francis Ltd
Date: 2004 (United Kingdom)
Readership: Professional & Vocational Microscopy
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"The World of Nano-Biomechanics"Mechanical Imaging and Measurement By Atomic Force Microscopy
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By using nanotechnological methods, we can poke around protein molecules, genes, membranes, cells and more. This book describes the physical properties of supporting structures from the molecular level with a special emphasis on their designs based on the mechanical strength and flexibility, membrane and other biological nanostructures. With illustrations. Hardback, 300 pages. Size: 229 x 152 mm. Weight: 623g.
Author: Ikai, Atsushi
ISBN: 044452777X
Publisher: Elsevier Science & Technology
Date: 2007 (Netherlands)
Readership: Professional & Vocational Microscopy
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"Synthetic Polymeric Membranes"Characterization By Atomic Force Microscopy
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"Springer Laboratory" series; Focuses on the method developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM). This book covers various aspects of AFM studies on the characterization of synthetic polymeric membranes. It is suitable for academic researchers who are investigating synthetic membranes. With 146 black & white illustrations, 51 black & white tables, 119 black & white halftones, 27 black & wh. Hardback, 216 pages. Size: 235 x 155 mm. Weight: 490g.
Author: Khulbe, K.C. Feng, C.Y. Matsuura, Tatsuo
ISBN: 3540739939
Publisher: Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
Date: 2007 (Germany)
Readership: Professional & Vocational Microscopy
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"Exploring Scanning Probe Microscopy With Mathematica"
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Retail $210.00 USD
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Provides a set of computational models that describe the physical phenomena associated with atomic force microscopy and related technologies. This work describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and others. It also features applications, dealing with, Kelvin and Raman probe microscopy. With illustrations. 2 rev ed. Hardback, 310 pages. Size: 209 x 176 mm. Weight: 733g.
Author: Sarid, D.
ISBN: 3527406174
Publisher: John Wiley and Sons Ltd
Date: 2007 (Germany)
Readership: Professional & Vocational Microscopy
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